Toward Customized Spatial Resolution in TDLAS Tomography
نویسندگان
چکیده
منابع مشابه
Toward fully automated high-resolution electron tomography.
Electron tomography is a powerful tool in elucidating the three-dimensional architecture of large biological complexes and subcellular organelles. Its use can be expanded through the simplification of the tomographic procedure by automation of its tasks. In this paper, we describe our EMACT/EMCAT system, which automates both tomographic data collection and reconstruction.
متن کاملEnhanced Spatial Resolution Using Iterative Focal Desmearing in Computed Tomography
Computed tomography reconstructions of projected data usually assume an ideal point-like focal spot. However, in practice, the actual finite focus size leads to blurred projections, unavoidably. The elements (voxels) of the reconstruction array are smeared differently as a function of their individual position relative to source and detector. Neglecting the focal smearing generates considerably...
متن کاملMonolithic integrated-optic TDLAS sensors
We are developing prototype chip-scale low-power integrated-optic gas-phase chemical sensors based on infrared Tunable Diode Laser Absorption Spectroscopy (TDLAS). TDLAS is able to sense many gas phase chemicals with high sensitivity and selectivity. Using semiconductor fabrication and assembly techniques, the low-cost integrated optic TDLAS technology will permit mass production of sensors tha...
متن کاملCustomized MFM probes with high lateral resolution
Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and poor lateral resolution when working under standard conditions. In this work, we present a conve...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Sensors Journal
سال: 2019
ISSN: 1530-437X,1558-1748,2379-9153
DOI: 10.1109/jsen.2018.2884085